| L. Ronchi Abbozzo | Fondazione Giorgio Ronchi, Firenze, Italy |
| G. Cadelano | CNR-ISAC, Padova, Italy |
| M. D'Acunto | CNR-IBF, Pisa, Italy |
| G. Ferrarini | CNR-ITC, Padova, Italy |
| X. Maldague | Laval University, Quebec, Canada |
| P. Martyniuk |
Military University of Technology, Warsaw, Poland |
| D. Moroni | CNR-ISTI, Pisa, Italy |
| V. Raimondi | CNR-IFAC, Firenze, Italy |
| T. Sakagami |
Osaka Institute of Technology, Osaka, Japan |
| M. Strojnik | Optical Research, León, Guanajuato, Mexico |
| M. Ziegler | BAM, Berlin, Germany |
| P. Burgholzer | RECENDT, Linz, Austria |
| S. Dehlau | DGZfP, Berlin, Germany |
| G. Dell'Avvocato | BAM, Berlin, Germany/Italy |
| A. Dillenz | Edevis, Leinfelden-Echterdingen, Germany |
| M. Goldammer | Siemens AG, Garching/München, Germany |
| C.U. Grosse | Technical University of Munich, Germany |
| M. Kreutzbruck | IKT, University of Stuttgart, Germany |
| J. Lecompagnon | BAM, Berlin, Germany |
| N. Meyendorf | University of Dayton, USA |
| M. Ricci | Sapienza Università di Roma, Italy |
| M. Stamm | BAM, Berlin, Germany |
| H.N. Rutt | University of Southampton, Southampton, United Kingdom |
| S. Sfarra | Università degli Studi dell’Aquila, L’Aquila, Italy |
| G. Steenackers |
University of Antwerp, Antwerp, Belgium |
| M. Volinia | Politecnico di Torino, Torino, Italy |
| H. Zhang | Harbin Institute of Technology, Harbin, China |